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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis

Guest editor P.W. Hawkes, By (author) Ludwig Reimer

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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Normally shipped | Available from overseas. Usually dispatched in 14 days
Publisher | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Published date | 1 Dec 2010
Language |
Format | Paperback / softback
Pages | 529
Dimensions | 235 x 155 x 0mm (L x W x H)
Weight | 0g
ISBN | 978-3-6420-8372-3
Readership Age |
BISAC | science / chemistry / physical & theoretical


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