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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers
Edited by Ambika Prasad Shah, Edited by Sudeb Dasgupta, Edited by Anand Darji, Edited by Jaynarayan Tudu
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normal price: R 3 414.95
Price: R 3 073.95
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| book description |
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
| product details |
Normally shipped |
Publisher | Springer International Publishing AG
Published date | 17 Dec 2022
Language |
Format | Paperback / softback
Pages | 596
Dimensions | 235 x 155 x 0mm (L x W x H)
Weight | 0g
ISBN | 978-3-0312-1513-1
Readership Age |
BISAC | computers / hardware / general
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Normally shipped |
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Normal Price | R 4 229.95
Price | R 3 806.95
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