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Windowed Fringe Pattern Analysis

By (author) Kemao Qian





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| book description |

This book provides solutions to the challenges involved in fringe pattern analysis, covering techniques for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. Both theoretical analysis and algorithm development are covered to facilitate the work of researchers and engineers. The information presented is also appropriate as a specialised subject for students of optical and computer engineering.

| product details |



Normally shipped | Enquiries only
Publisher | SPIE Press
Published date | 30 Sep 2013
Language |
Format | Paperback / softback
Pages | 277
Dimensions | 0 x 0 x 0mm (L x W x H)
Weight | 556g
ISBN | 978-0-8194-9641-6
Readership Age |
BISAC | technology / optics


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