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Particle Beam Physics

Series edited by Tom Mulvey, Series edited by Benjamin Kazan, Edited by Peter W. Hawkes






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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Normally shipped | Enquiries only
Publisher | Elsevier Science & Technology
Published date | 27 Oct 1998
Language |
Format | Hardback
Pages | 416
Dimensions | 229 x 152 x 0mm (L x W x H)
Weight | 744g
ISBN | 978-0-1201-4747-2
Readership Age |
BISAC | technology / electricity


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Broken Country: AMAZON'S BOOK OF THE YEAR - THE MILLION-COPY BESTSELLER

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