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Advances in Imaging and Electron Physics: v. 99

Series edited by Tom Mulvey, Series edited by Benjamin Kazan, Edited by Peter W. Hawkes






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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

| product details |



Normally shipped | Enquiries only
Publisher | Elsevier Science & Technology
Published date | 19 Oct 1997
Language |
Format | Hardback
Pages | 337
Dimensions | 229 x 152 x 0mm (L x W x H)
Weight | 654g
ISBN | 978-0-1201-4741-0
Readership Age |
BISAC | technology / material science


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